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Test & Measurement

	Event		Date/Time		Length
	Oscilloscope Mask Testing - Improve Quality by Testing More Waveforms per Second Using Hardware Acceleration Agilent Technologies and MetricTest		Nov 04, 2009		60 min.
	Conquering Noise for Accurate RF and Microwave Signal Measurements Agilent Technologies		Oct 29, 2009		60 min.
	A Technique for Measuring Fuel Cell AC Impedance Agilent Technologies		Oct 28, 2009		60 min.
	New Power Device Analyzer/Curve Tracer Solves High Power Device Testing Challenges Agilent Technologies		Oct 22, 2009		60 min.
	Addressing the Design & Verification Challenges of Cognitive Radio and SDR Agilent Technologies		Oct 07, 2009		60 min.
	Tips to Debug DDR Parametric and Protocol Measurements with an MSO Agilent Technologies		Oct 01, 2009		60 min.
	Developing Flexible Terrestrial Solar Cell/Module I-V Characterization Solutions Agilent Technologies		Sep 23, 2009		60 min.
	Uplink Power Control in LTE Rohde & Schwarz		Sep 23, 2009		60 min.
	Simplifying Debug of Mixed Signal Embedded Designs Tektronix		Aug 26, 2009		60 min.
	Boosting Yield and Increasing Quality with Power-Aware Test and Small Delay Defect Testing Synopsys		Aug 05, 2009		60 min.
	High Power Amplifier Design Using Accurate Non-Linear Models in Agilent Genesys RF/MW Software Agilent Technologies		Jul 16, 2009		60 min.
	Intermodulation distortion (IMD) measurements with improved speed and accuracy Agilent Technologies		Jul 14, 2009		60 min.
	How To Pass The Receiver Compliance Test For PCI Express® Agilent Technologies		Jun 30, 2009		60 min.
	RFIC on-chip passive modeling with EM (Electromagnetic) simulation on advanced CMOS technology nodes Agilent Technologies		Jun 25, 2009		60 min.
	Advanced Nonlinear Device Characterization Utilizing Nonlinear Vector Network Analyzer and X-parameters with Arbitrary Load Dependence Agilent Technologies		Jun 24, 2009		60 min.

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