Mentor Graphics

ScanBurst is a new and innovative at-speed DFT (Design-for-Test) tool from LogicVision designed specifically to overcome the limitations of traditional at-speed DFT techniques. ScanBurst is designed specifically to compliment existing ATPG based DFT techniques by providing an environment to easily insert scan and clock control structures for at-speed testing based on LogicVision's patented BurstMode Timing technology. Benefits of using ScanBurst include increased TDF coverage, reduced test pattern volume and test time and reduced test generation time. ScanBurst is integrated with Mentor's FastScan ATPG and TestKompress embedded compression products, and provides a seamless solution that fits within existing scan-based DFT flows.