Overview:
With the increase in speed of digital system design into the gigahertz region, frequency dependent effects become a more prominent challenge than in the past. The proliferation of high speed serial data formats in today's digital standards demand differential circuit topology. A paradigm shift in measurement technology is required to achieve the design goals of the advanced differential physical layer. It is now necessary to consider both time and frequency domain analysis to obtain proper characterization. This presentation reviews TDR, S-Parameters, and Differential measurements using a TDR.
Duration: One hour
Who Should Attend:
R&D designers, engineers, and project managers working on high-speed digital designs; who spend a significant amount of time in the debug and validation phase dealing with signal integrity related problems in their designs.
Giveaway:
Registrants who complete the feedback form by January 14, 2009 will be entered in a drawing to win one of two autographed copies of Eric Bogatin's book, "Signal Integrity Simplified". Drawing only open to residents of the 50 United States and Canada (except Quebec). Official Rules
Presenter:
Tom Phillips, Agilent Technologies
Tom Phillips is an application engineer for time domain reflectometry and sampling oscilloscopes. He has 30 years of experience with analog and digital design and measurement. Tom has a BSEE from UC Berkeley and an MSEE from Cornell University. In his spare time, Tom referees youth soccer and is a home winemaker.
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