Reliability is Vital - Learn about Single Event Upset (SEU) Immunity in Terrestrial FPGA Applications
Integrated circuit malfunctions due to subatomic radiation particles are now becoming an increasing concern for sea level applications. In high impact applications such as automation, communications infrastructure, medical and avionics, designers cannot afford to take risks with their FPGA devices. Down time is not an option, loss of communication is not acceptable, and loss of automation and control is not tolerated
With its long heritage of supplying high reliability products to the military and aerospace markets, Microsemi supplies two FPGA technologies (antifuse and flash) with demonstrated SEU immunity. Learn the difference between antifuse and flash and how to avoid reliability risks in choosing an FPGA.
Who should attend: Reliability engineers and FPGA designers of high impact terrestrial applications for medical, automotive, industrial, military and avionics segments.
Presenter: Minal Sawant, Product Marketing (medical, military and avionics), Microsemi, SoC Products Group
• Basics of Single-Event Effects
• Neutrons and Alpha Particles
• Flash vs. SRAM
• SEU in Medical, Avionics, Network and Infrastructure Applications
• Case Study
Share this invitation with your colleagues. A recorded version of the webinar and all presentation materials will be available after the event.