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Developing High-Reliability Reprogrammable NVM IP for Automotive Applications

Authored on: Jul 1, 2014 by Martin Niset, Craig Zajac

Technical Paper

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To help IC designers understand the complexities in developing the highest reliability non-volatile memory (NVM) IP for automotive applications, this white paper will review key considerations from design to test, including: key reliability specifications, designing-in reliability, and demonstrating reliability through characterization, qualification, and reliability testing. This paper helps IC designers make informed choices for their automotive designs, from developing the NVM IP in-house to selecting the optimal IP supplier.
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