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Root Cause Deconvolution: The Next Step in Diagnosis Resolution Improvement

Authored on: Mar 19, 2014 by Geir Eide

Technical Paper

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Root Cause Deconvolution (RCD) is the next step in scan test diagnosis resolution enhancement. It works by analyzing multiple layout-aware diagnosis reports together to identify the underlying defect distribution (root cause distribution) that is most likely to explain this set of diagnosis results. The results are then back-annotated to the individual diagnosis suspects. Where layout-aware diagnosis points to a segment, RCD can isolate a particular root cause in that segment. This increase in the FA relevance and success rate dramatically reduces the failure analysis (FA) cycle time from months to days.
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