datasheets.com EBN.com EDN.com EETimes.com Embedded.com PlanetAnalog.com TechOnline.com  
Events
UBM Tech
UBM Tech

Pattern Matching: Blueprints for Further Success

Authored on: Nov 22, 2013 by Jonathan Muirhead, Hend Wagieh

Technical Paper

0 0
More InfoLess Info
Design patterns have a wide variety of applications in the design, verification and test flows of IC development. From significantly reducing rule deck complexity to simplifying the task of avoiding known yield detractors to enhancing workflows such as design rule waiver recognition, pattern matching has become a useful tool throughout design, verification, and test process. Learn how Calibre Pattern Matching software can help you implement automated pattern capture and pattern matching in your various IC flows for maximum success at emerging process nodes.
0 comments
write a comment

Please Login

You will be redirected to the login page

×

Please Login

You will be redirected to the login page

×

Please Login

You will be redirected to the login page