datasheets.com EBN.com EDN.com EETimes.com Embedded.com PlanetAnalog.com TechOnline.com  
Events
UBM Tech
UBM Tech

Scaling the Memory Reliability Wall

Authored on: May 24, 2013 by Chris Wilkerson et al

Technical Paper

0 0
More InfoLess Info
Technology scaling reduces the size of memory cells, continuing to deliver dramatic improvements in memory density. Increasing memory density, however, also increases susceptibility to known failure types. This paper highlights some of the common failure modes in today's memory technologies as well as uncommon failure modes that may grow in significance on future technology nodes. A number of approaches are described to efficiently compensate for failure-prone memory, and argue that a key ingredient in resilient systems is the ability to compensate for unanticipated memory failures.
0 comments
write a comment

Please Login

You will be redirected to the login page

×

Please Login

You will be redirected to the login page

×

Please Login

You will be redirected to the login page