In developing high-quality and reliable MTP NVM, NVM IP providers must account for design and architectural considerations as well as comprehensive silicon testing. To help system-on-chip (SoC) designers select the highest reliability NVM IP, this white paper will review the key considerations involved in the entire process from design to test, including: key reliability specifications; designing-in reliability; and demonstrating reliability through characterization, qualification, and reliability testing.
Synopsys, Inc.
(Nasdaq:SNPS) accelerates innovation in the global electronics market. As a
leader in electronic design automation (EDA) and semiconductor IP, its
software, IP and services... Read More
Technical Paper
1
0
Download to Print
Add to bookmarks
0 comments
write a comment