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Overview:
A defect found during device software development may cost upwards of $100 to fix. If the defect is caught in QA, the repair cost increases by a factor of 10. If the defect remains undiscovered and winds up in a field-deployed device, the repair cost can be a staggering 100 times the original price tag for fixing the glitch.
Uncovering defects early in the development cycle avoids exponential QA and support costs. With more than half of the average development schedule budgeted for testing and QA, finding more efficient ways to diagnose and test code will directly impact your time-to-market, bill of materials, and device reliability, as well as free up your resources to focus on differentiating product features.
This webinar will discuss common diagnostic and test challenges developers face, as well as introduce new Eclipse-based tools you can use to dramatically improve the way you qualify your product for market. Who Should Attend
- Device software engineers
- Device software product manager
- Quality assurance engineers
- Project managers
What You'll Learn
- New ways to implement a standard method of unit testing, code integration testing, and code coverage analysis
- How to leverage integrated tools that enable dynamic visualization and analysis of code to uncover memory leaks, analyze device performance, and execution trace
- How to use dynamic instrumentation tools to securely record, isolate, diagnose, and correct device software defects in a running system
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